DATE 17 Conf 2nd Keynote: IoT Optimization Needs Multiple Methods [Nikkei Electronics]

Nikkei Electronics is reporting on the Design Automation and Test Europe conference in Lausanne Switzerland this week. Below is a link that uses Google Translate to render their article on the second keynote, by IBM, into English. There are many photos of the conference technical slides included in the article.

DATE 17 Conf 2nd Keynote: IoT Optimization Needs Multiple Methods courtesy of Nikkei Electronics.

 

 




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